Ventilation pollution analysis
X-ray fluorescence analysis can be applied for element determination in pollutions, aerosol, gas and gas wastes of various plants. Air pollution is aspirated with filter and element determination sedimented on filter in spectrometer.
The advantage of the method is total absence of sample preparation, as well as wide range of determined elements from one filter. The time required for analysis depends on the number of elements and is typically about 1 minute per element.
The method sensitivity is from n*0,01 mg/m3, that provides determination of all methods under control.
The most often met elements and compounds determined by XRFA are Fe, Mn, Mo, Hg, Ni, Nb, Pb, Se, S, Co, MgO, Al, SiO2, Cd, Cu, Cr2O3, CrO3, Te, Bi, Tl, Ag, Sb, As, Ti, CaO, Ba, Sn, W.
The advantage of the method is total absence of sample preparation, as well as wide range of determined elements from one filter. The time required for analysis depends on the number of elements and is typically about 1 minute per element.
The method sensitivity is from n*0,01 mg/m3, that provides determination of all methods under control.
The most often met elements and compounds determined by XRFA are Fe, Mn, Mo, Hg, Ni, Nb, Pb, Se, S, Co, MgO, Al, SiO2, Cd, Cu, Cr2O3, CrO3, Te, Bi, Tl, Ag, Sb, As, Ti, CaO, Ba, Sn, W.
"SPECTROSCAN MAKC-GVM" WDXRF spectrometer determines elements from Na (Sodium) to U (Uranium) in solids, liquids or powders, in solutions and thin films, deposits on filters.
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Wavelength dispersive X-ray fluorescent WDXRF scanning spectrometer for determination of chemical elements in the range from Ca (Calcium) to U (Uranium) in various compounds.
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:SPECTROSCAN МАКС-GF1(2)E" is a modification of WDXRF "SPECTROSCAN МАКС-G" spectrometer with one or two additional EDXRF channels.
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