NPP technological water analysis
X-ray fluorescence method provides solution of several problems of constructive materials corrosion, optimal water-chemical regimes.
Special chemical agents are introduced while chemical washing. This solution is driven away by clean water after circulation in the circuit at a given temperature. The process of clean water introduction shall be started before the corrosive sedimentation begins to prevail over its solution in the heat carrier. One of the ways to control the process is determination of element composition of the washing solution at all stages of washing.
Data on dispersive admixtures composition are required for the study and simulation of negative processes (mass transfer of corrosive products, aerosols, sediment growth, water transparency reduction) and for development of measures for water-chemical regime optimization, filtration and so on.
Sampling of ion-exchange filter materials from the first, second and third circuits is made for analysis and complex physical and chemical diagnostics.
All the problems mentioned above are successfully solved with X-ray fluorescence analysis.
Special chemical agents are introduced while chemical washing. This solution is driven away by clean water after circulation in the circuit at a given temperature. The process of clean water introduction shall be started before the corrosive sedimentation begins to prevail over its solution in the heat carrier. One of the ways to control the process is determination of element composition of the washing solution at all stages of washing.
Data on dispersive admixtures composition are required for the study and simulation of negative processes (mass transfer of corrosive products, aerosols, sediment growth, water transparency reduction) and for development of measures for water-chemical regime optimization, filtration and so on.
Sampling of ion-exchange filter materials from the first, second and third circuits is made for analysis and complex physical and chemical diagnostics.
All the problems mentioned above are successfully solved with X-ray fluorescence analysis.
"SPECTROSCAN MAKC-GVM" WDXRF spectrometer determines elements from Na (Sodium) to U (Uranium) in solids, liquids or powders, in solutions and thin films, deposits on filters.
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Wavelength dispersive X-ray fluorescent WDXRF scanning spectrometer for determination of chemical elements in the range from Ca (Calcium) to U (Uranium) in various compounds.
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:SPECTROSCAN МАКС-GF1(2)E" is a modification of WDXRF "SPECTROSCAN МАКС-G" spectrometer with one or two additional EDXRF channels.
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