Nonferrous alloys analysis
Permanent control of alloy chemical composition will guarantee high quality of the products. Analysis is usually carried out for smelting control and certification of the end products.
The plants consuming nonferrous alloys need entrance control of the alloys chemical composition. The same task may have consumers at the stage of the products exploitation, maintenance and repairing.
Chemical analysis methods most often are gravimetric, titrimetric or colorimetric methods, they are complicated in operation, not universal, have low sensitivity (especially at low concentrations).
The X-ray fluorescence method provides determination of elements in the range from Na to U with the concentration range from 0.001-0.01% to 100%. High relative accuracy of determination (0.1-0.3%), high efficiency and rapidness, simple sample preparation lead to wide application of XRF method for nonferrous alloys analysis.
Sample preparation consists of flattering the sample surface. The roughness of the surface shall be better than 50 micron, has no cracks, porous or cavities, no slag or nonmetal inclusions.
No further sample preparation is required. The sample is placed into a sample cartridge and then into spectrometer. Analysis is fulfilled automatically with a chosen program and prepared calibration curve.
Small size specimens or irregular shape specimens can be analyzed with fundamental parameters method.(standardless analysis method). In the latter case no calibration samples are required, but the accuracy of analysis is a little bit worse.
The plants consuming nonferrous alloys need entrance control of the alloys chemical composition. The same task may have consumers at the stage of the products exploitation, maintenance and repairing.
Chemical analysis methods most often are gravimetric, titrimetric or colorimetric methods, they are complicated in operation, not universal, have low sensitivity (especially at low concentrations).
The X-ray fluorescence method provides determination of elements in the range from Na to U with the concentration range from 0.001-0.01% to 100%. High relative accuracy of determination (0.1-0.3%), high efficiency and rapidness, simple sample preparation lead to wide application of XRF method for nonferrous alloys analysis.
Sample preparation consists of flattering the sample surface. The roughness of the surface shall be better than 50 micron, has no cracks, porous or cavities, no slag or nonmetal inclusions.
No further sample preparation is required. The sample is placed into a sample cartridge and then into spectrometer. Analysis is fulfilled automatically with a chosen program and prepared calibration curve.
Small size specimens or irregular shape specimens can be analyzed with fundamental parameters method.(standardless analysis method). In the latter case no calibration samples are required, but the accuracy of analysis is a little bit worse.
"SPECTROSCAN MAKC-GVM" WDXRF spectrometer determines elements from Na (Sodium) to U (Uranium) in solids, liquids or powders, in solutions and thin films, deposits on filters.
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