Research

X-ray fluorescence analysis XRFA method is one of the most important methods of elemental composition determination due to its simplicity in application and simple sample preparation.

There are two main types of X-ray fluorescence spectrometers:

Wavelength dispersive x-ray fluorescence spectrometers (WDXRF spectrometers)
X-ray diffraction on a crystal is used to select fluorescence line or any part of x-ray spectrum by this method. The method has high lines resolution capacity and therefore capable to analyze complicated multi component substances (alloys for example).

Energy dispersive x-ray fluorescence spectrometers (EDXRF spectrometers)
Special detectors providing electric signal proportional to the energy of the X-ray radiation energy are used in this method. To select a part of X-ray spectrum detector pulses amplitude selection is realized. These instruments are less universal, but smaller and economic efficient in definite cases. Complicated compositions analysis is rather difficult  because of significant overlapping of adjacent lines. Usually these instruments are used for definite routine analysis, but not for research.

Wavelength dispersive WDXRF "SPECTROSCAN MAKC-" spectrometers are ideal instruments for research problems solution:
•    Can determine with high precision element content from Na to U in any substances being in solid, liquid, powder state or solutions, filters, foils;
•    WDXRF provides high  spectrum resolution of 45 eV for FeKα line and  9 eV for SiKα;
•    Sample preparation is simple. The specimen is at the ambient conditions while measurement;
•    Automatic sample changer for 10 samples;
•    No gas consumption, closed cycle cooling system, no additional water supply required;
•    Completely x-ray safe.