Soil analysis

X-ray fluorescence method provides determination of not only soil composition, but bottomsets as well.

The most often metal elements determined in soil and bottomset: Pb, Ce, La, Ba, Nb, Zr, Y, Sr, Rb, As, Zn, Cu, Ni, Co, Fe, Mn, Cr, V, Ti.  The low limit of quantitative determination of this elements is about 0,001% (or 10 ppm).
Light elements: Ca, K, Cl, S, P, Si, Al, Mg, Na can be determined from 0,005% (Сa-Si), Al– 0,02%, Mg - 0,1%, Na - 2%.

The sample preparation consists of sample material drying and grinding to the particle size about 50 micron.
Grinded sample material is pressed in pellets, which are analyzed in a spectrometer according to the chosen program.

XRFA can determine total element content in a sample, as well as soluble forms of elements. In the latter case the sample material shall be treated with acid to dissolve unsolved compounds and then concentrated.


"SPECTROSCAN MAKC-GVM" WDXRF spectrometer determines elements from Na (Sodium) to U (Uranium) in solids, liquids or powders, in solutions and thin films, deposits on filters. 

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Wavelength dispersive X-ray fluorescent WDXRF scanning spectrometer for determination of chemical elements in the range from Ca (Calcium) to U (Uranium) in various compounds.

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:SPECTROSCAN МАКС-GF1(2)E" is a modification of WDXRF  "SPECTROSCAN МАКС-G" spectrometer with one or two additional EDXRF channels.

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